Platform · Causal Defect Feedback
Trace every defect to its source.
Causal Defect Feedback correlates defect signatures with manufacturing context to identify where defects originate, quantify yield impact, and prevent recurrence across the production line.
Why it matters
Where CDF earns its keep.
Defect data should accelerate process improvement, not delay decisions. Inspection systems flag defects, but connecting them back to tools, chambers, recipes, and manufacturing events stays largely manual.
Causal Defect Feedback correlates defect signatures with manufacturing context to identify where defects originate, quantify yield impact, and prevent recurrence across the line.
Core capabilities
What Causal Defect Feedback does.
Defect signatures connected to their manufacturing origin - ranked by yield impact.
Defect Attribution
Trace each defect signature to the tool, chamber, and step that produced it.
Yield Intelligence
Quantify the yield impact of every defect mode, ranked by cost.
Cross-Tool Correlation
Signatures matched across tools to expose shared, systemic causes.
From inspection map to originating chamber.
Representative attribution of an edge-ring signature to a single chamber.
Representative time saved connecting inspection data to root cause.
Representative cross-tool correlation isolating the originating chamber.
One shared core
Every attribution makes the next one faster.
Each defect traced - the signature it matched, the tools it ruled out, the chamber it pinned - is written back into the shared knowledge graph, where every other module draws on it. Yield know-how that once lived in a few experts’ heads becomes an asset the whole organization owns.
See the whole platformIn the field
“The inspection map used to tell us we had a problem. Now it tells us which chamber caused it - before the next lot runs.”
The rest of the platform
Three more modules on the same engine.
Security
Your data, your control.
We safeguard your information with advanced security protocols and strict compliance standards. Deploy in your VPC or fully on-prem / air-gapped - your data never leaves your environment.
SOC 2 Type IIAudited security controls
ISO 27001Information security management
CCPAData privacy complianceFAQ
Questions from the fab floor.
How is Causal Intelligence different from correlation-based analytics?
It models cause and effect across your operational knowledge graph, so you get the true driver with the evidence behind it - not just a correlated signal that leaves engineers guessing.
How long does a pilot take?
A typical pilot runs 60-90 days on your own operational data, with measurable impact on RCA cycle time by the end of the engagement.
Where does our data live?
Deploy in your VPC or fully on-prem / air-gapped - data never leaves your environment. We hold SOC 2 Type II, ISO 27001, and CCPA.
Which systems does it connect to?
MES, SPC/FDC, historians, EDA & yield, PLM, CMMS, and ticketing - all feed the CIP Core evidence layer through standard connectors.
Do we need a data-science team to run it?
No. Enterprise MLOps governs fab-specific models for you, so engineers work inside the resolution workflow instead of notebooks.
Trace your next defect to its source.
Start with a 60-90 day pilot on one defect mode and one product line, with a clear yield metric. See Causal Defect Feedback connect inspection data to the originating tool on your own line.
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